Victor Soltwisch

Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements

Anton Haase, S. Bajt, Philipp Hönicke et al. · Journal of Applied Crystallography · 2016 · 37 citations · Full text

Reconstructing detailed line profiles of lamellar gratings from GISAXS patterns with a Maxwell solver

Victor Soltwisch, Analía Fernández Herrero, Mika Pflüger et al. · Journal of Applied Crystallography · 2017 · 35 citations · Full text

Grazing-incidence small-angle X-ray scattering (GISAXS) on small periodic targets using large beams

Mika Pflüger, Victor Soltwisch, Jürgen Probst et al. · IUCrJ · 2017 · 34 citations · Full text

Interface morphology of Mo/Si multilayer systems with varying Mo layer thickness studied by EUV diffuse scattering

Anton Haase, Victor Soltwisch, Stefan Braun et al. · Optics Express · 2017 · 27 citations · Full text

Engineering, Mo Layer Thicknesses, Optical Testing +22

Status of EUV reflectometry at PTB

Christian Laubis, Annett Barboutis, Martin Biel et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013 · 27 citations

Short Wavelength Optic, Engineering, Optical Testing +21