T.C. van den Dool

Publications

146

Citations

H-Index

1996

Active since

Affiliations

Netherlands Organisation for Applied Scientific Research(Current)

Delft University of Technology

T.C. van den Dool is an author at Netherlands Organisation for Applied Scientific Research specializing in instrumentation, applied physics, and microfabrication.

Top concepts

InstrumentationEngineeringApplied PhysicsMicrofabricationEducationPhotonicsMicroscopyMeasurementMaterial ScienceMicroelectronics

Publications per year

1996–2014

Publications

Characterization of Integrated Optical Strain Sensors Based on Silicon Waveguides

W.J. Westerveld, S.M. Leinders, P.M. Muilwijk et al. · IEEE Journal of Selected Topics in Quantum Electronics · 2013 · 26 citations · Full text

Waveguides, Optical Materials, Engineering +23

Characterization of a photonic strain sensor in silicon-on-insulator technology

W.J. Westerveld, José Pozo, P.J. Harmsma et al. · Optics Letters · 2012 · 26 citations

Introduction of a high throughput SPM for defect inspection and process control

Hamed Sadeghian, N.B. Koster, T.C. van den Dool · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013 · 24 citations

High Throughput Spm, Engineering, Industrial Engineering +26

Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems

R.W. Herfst, Wimar Klop, Martin Eschen et al. · Measurement · 2014 · 20 citations

Systematic Characterization, Photonics, Optical Materials +14

MEASURING TGV SOURCE STRENGTH WITH SYNTACAN

J.D. van der Toorn, H.F.J. Hendriks, T.C. van den Dool · Journal of Sound and Vibration · 1996 · 14 citations

Measurement, Calibration, Instrument Science +4

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