Shih-Hao Tsai

Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor

Shih-Hao Tsai, Zihang Fang, Xinghua Wang et al. · ACS Applied Electronic Materials · 2022 · 45 citations · Full text

Non-volatile Memory, Engineering, Emerging Memory Technology +17

First Demonstration of Ultra-low D_it Top-Gated Ferroelectric Oxide-Semiconductor Memtransistor with Record Performance by Channel Defect Self-Compensation Effect for BEOL-Compatible Non-Volatile Logic Switch

Chun-Kuei Chen, Zihang Fang, Sonu Hooda et al. · 2022 International Electron Devices Meeting (IEDM) · 2022 · 28 citations · Full text

Low-power Electronics, Record Performance, Electrical Engineering +14

Low-Thermal-Budget BEOL-Compatible Beyond-Silicon Transistor Technologies for Future Monolithic-3D Compute and Memory Applications

Aaron Thean, Shih-Hao Tsai, Chun-Kuei Chen et al. · 2022 International Electron Devices Meeting (IEDM) · 2022 · 20 citations

Overcoming Negative nFET V_TH by Defect-Compensated Low-Thermal Budget ITO-IGZO Hetero-Oxide Channel to Achieve Record Mobility and Enhancement-mode Operation

Sonu Hooda, Chun-Kuei Chen, Shih-Hao Tsai et al. · 2023 · 18 citations

Low-power Electronics, Electrical Engineering, Semiconductor Device +10

High-Performance Top-Gated and Double-Gated Oxide–Semiconductor Ferroelectric Field-Effect Transistor Enabled by Channel Defect Self-Compensation Effect

Chun-Kuei Chen, Sonu Hooda, Zihang Fang et al. · IEEE Transactions on Electron Devices · 2023 · 16 citations · Full text

Semiconductors, Semiconductor Technology, Electrical Engineering +13