C. A. Paulson

Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement

A. Karbassi, D. Ruf, Alan D. Bettermann et al. · Review of Scientific Instruments · 2008 · 76 citations

Epitaxial GaN1−yAsy layers with high As content grown by metalorganic vapor phase epitaxy and their band gap energy

Akitaka Kimura, C. A. Paulson, H. F. Tang et al. · Applied Physics Letters · 2004 · 48 citations · Full text

Materials Science, Wide-bandgap Semiconductor, Epitaxial Growth +12

High crystalline-quality III-V layer transfer onto Si substrate

Peng Chen, Yi Jing, S. S. Lau et al. · Applied Physics Letters · 2008 · 25 citations

Materials Science, Materials Engineering, Electrical Engineering +14

Industrial-grade anti-reflection coatings with extreme scratch resistance

C. A. Paulson, James J. Price, Karl Köch et al. · Optics Letters · 2019 · 17 citations

Optical Materials, Engineering, Mechanical Engineering +17

Nanoindentation Hardness and Practical Scratch Resistance in Mechanically Tunable Anti-Reflection Coatings

James J. Price, Tingge Xu, Binwei Zhang et al. · Coatings · 2021 · 17 citations · Full text

Engineering, Mechanical Engineering, Surface Technology +16