Gino Giusi

$1/f$ Noise in Drain and Gate Current of MOSFETs With High-$k$ Gate Stacks

Paolo Magnone, Felice Crupi, Gino Giusi et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 124 citations · Full text

Gate Stacks, Gate Dielectrics, Electrical Engineering +13

Ultraflexible Tactile Piezoelectric Sensor Based on Low-Temperature Polycrystalline Silicon Thin-Film Transistor Technology

Francesco Maita, Luca Maiolo, A. Minotti et al. · IEEE Sensors Journal · 2015 · 73 citations

Engineering, Piezoelectric Properties, Ultraflexible Tactile Sensor +18

Impact strain engineering on gate stack quality and reliability

C. Claeys, E. Simoen, S. Put et al. · Solid-State Electronics · 2008 · 73 citations

Reliability Engineering, Engineering, Impact Strain Engineering +7

Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics

Gino Giusi, Felice Crupi, C. Nick Pace et al. · IEEE Transactions on Electron Devices · 2006 · 59 citations

Hafnium-based Gate Dielectrics, Electrical Engineering, Engineering +14

Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies

Paolo Magnone, Felice Crupi, Nicole Wils et al. · IEEE Transactions on Electron Devices · 2011 · 55 citations

Hc Stress, Engineering, Gate Dielectric +17