D.M. Boulin

A symmetric submicron CMOS technology

S.J. Hillenius, R. Liu, G. E. Georgiou et al. · 1986 · 66 citations

Engineering, Electrical Engineering, Microelectronics +16

Oxide thickness measurements up to 120 Å on silicon and aluminum using the chemically shifted auger spectra

C. C. Chang, D.M. Boulin · Surface Science · 1977 · 60 citations

Natural Sciences, Materials Engineering, Materials Science +14

Interfacial Dopants for Dual-Dielectric, Charge-Storage Cells

D. Kahng, W. J. Sundburg, D.M. Boulin et al. · Bell System Technical Journal · 1974 · 40 citations

Engineering, Materials Engineering, Materials Science +12

Verification of electron distributions in silicon by means of hot carrier luminescence measurements

L. Selmi, M. Mastrapasqua, D.M. Boulin et al. · IEEE Transactions on Electron Devices · 1998 · 36 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Differential studies of dual-dielectric charge-storage cells

K.K. Thornber, D. Kahng, D.M. Boulin et al. · Journal of Applied Physics · 1978 · 14 citations

Engineering, Electrical Engineering, Materials Science +17