R. Lahri

Poly emitter bipolar hot carrier effects in an advanced BiCMOS technology

S.P. Joshi, R. Lahri, Craig Lage · 1987 · 60 citations

Device Modeling, Transistor Current Gain, Electrical Engineering +10

Characterization of transistor mismatch for statistical CAD of submicron CMOS analog circuits

Christopher J. Abel, C. Michael, M. Wagih Ismail et al. · 1993 IEEE International Symposium on Circuits and Systems · 2002 · 31 citations

Device Modeling, Statistical Cad, Electrical Engineering +13

Transient substrate current effects on n-channel MOSFET device lifetime

H. Wang, M. Davis, R. Lahri · 2003 · 16 citations

Electrical Engineering, Mosfet Device Lifetime, Engineering +14

Mismatch drift: a reliability issue for analog MOS circuits

C. Michael, H. Wang, C.S. Teng et al. · 1992 · 15 citations

Reliability, Electrical Engineering, Reliability Engineering +11

Advanced One Micron BICMOS Technology for High Speed 256K SRAMS

Behnam Bastani, Craig Lage, Leon Wong et al. · Symposium on VLSI Technology · 1987 · 11 citations

Electrical Engineering, Engineering, Vlsi Design +11