C.S. Teng

Characterization of transistor mismatch for statistical CAD of submicron CMOS analog circuits

Christopher J. Abel, C. Michael, M. Wagih Ismail et al. · 1993 IEEE International Symposium on Circuits and Systems · 2002 · 31 citations

Device Modeling, Statistical Cad, Electrical Engineering +13

Mismatch drift: a reliability issue for analog MOS circuits

C. Michael, H. Wang, C.S. Teng et al. · 1992 · 15 citations

Reliability, Electrical Engineering, Reliability Engineering +11

n/sup +/-poly-to-n/sup +/-silicon capacitor structures for single-poly analog CMOS and BiCMOS processes

Tsyr‐Shyang Liou, C.S. Teng · IEEE Transactions on Electron Devices · 1989 · 10 citations

Materials Science, Electrical Engineering, Engineering +15

Investigation of charging damage induced V/sub t/ mismatch for submicron mixed-signal technology

Jie Zhao, H.S. Chen, C.S. Teng · 1996 · 10 citations

Electrical Engineering, Engineering, Circuit System +15

A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits

Christopher Michael, Christopher J. Abel, C.S. Teng · International Conference on Computer Aided Design · 1993 · 10 citations

Submicrometer Analog, Engineering, Measurement +19