Statistics
Publications
2
Citations
34
H-Index
2
Active since
2003
M. Davis is an author specializing in single event effects, engineering, and transient electronics.
Publications per year
2003–2003
2
2
Transient hot-electron effect on n-channel device degradation (MOSFETs)
Huamin Wang, M. Davis, Han De et al. · 2003 · 18 citations
Device Modeling, Electrical Engineering, Semiconductor Device +14
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