Statistics
Publications
2
Citations
30
H-Index
2
Active since
2002
Affiliations
IBM (United States)(Current)
Han De is an author at IBM (United States) specializing in microelectronics, engineering, and semiconductor devices.
Publications per year
2002–2003
2
2
Transient hot-electron effect on n-channel device degradation (MOSFETs)
Huamin Wang, M. Davis, Han De et al. · 2003 · 18 citations
Engineering, Electrical Engineering, Electronic Materials +16
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