Matthias Küchler

Hard x-ray nanoprobe based on refractive x-ray lenses

Christian G. Schroer, O. Kurapova, Jens Patommel et al. · Applied Physics Letters · 2005 · 369 citations

Optical Materials, X-ray Spectroscopy, Lateral Extension +19

A novel high aspect ratio technology for MEMS fabrication using standard silicon wafers

A. Bertz, Matthias Küchler, R. Knöfler · Sensors and Actuators A Physical · 2002 · 52 citations

Electrical Engineering, Wafer Scale Processing, Engineering +10

The Impact of Wettability and Surface Roughness on Fluid Displacement and Capillary Trapping in 2‐D and 3‐D Porous Media: 2. Combined Effect of Wettability, Surface Roughness, and Pore Space Structure on Trapping Efficiency in Sand Packs and Micromodels

Bilal Zulfiqar, Hannes Vogel, Yi Ding et al. · Water Resources Research · 2020 · 50 citations · Full text

Pore Structure, Engineering, Fluid Properties +14

Optimized fabrication of silicon nanofocusing x-ray lenses using deep reactive ion etching

O. Kurapova, B. Lengeler, Christian G. Schroer et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2007 · 24 citations

Engineering, Electron-beam Lithography, Microscopy +22

Hard X-Ray Nanoprobe based on Refractive X-Ray Lenses

Christian G. Schroer, O. Kurapova, Jens Patommel et al. · AIP conference proceedings · 2007 · 18 citations