Statistics
Publications
3
Citations
138
H-Index
3
Active since
2004
Affiliations
Intel (United States)(Current)
Enamul Amyeen is an author at Intel (United States) specializing in computer engineering, software testing, and engineering.
Publications per year
2004–2006
3
3
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor
S. Venkataraman, S. Sivaraj, Enamul Amyeen et al. · 2004 · 71 citations
Engineering, Computer Architecture, Test Data Generation +16
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive
Ruifeng Guo, Subhasish Mitra, Enamul Amyeen et al. · 2006 · 47 citations
Defect diagnosis based on pattern-dependent stuck-at faults
Irith Pomeranz, S. VENKATARAMAN, S.M. Reddy et al. · 2004 · 20 citations
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