J. McKee

CMOS imager technology shrinks and image performance

H. Rhodes, Gennadiy Agranov, Chenglin Hong et al. · 2004 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +17

A shallow trench isolation using LOCOS edge for preventing corner effects for 0.25/0.18 μm CMOS technologies and beyond

Amitava Chatterjee, D. Rogers, J. McKee et al. · 2002 · 35 citations

Engineering, Electrical Engineering, Microelectronics +15

Finding the edges of the surfaces of three-dimensional curved objects by computer

J. McKee, J.K. Aggarwal · Pattern Recognition · 1975 · 27 citations

Computing, Computer Science, Visualization +12

Development of a Production-Ready, Back-Illuminated CMOS Image Sensor with Small Pixels

Tom Joy, Sung Gyu Pyo, Sung-Hyung Park et al. · 2007 · 19 citations

Engineering, Electrical Engineering, Manufacturing Engineering +17

Oxide thickness dependence of inverter delay and device reliability for 0.25 μm CMOS technology

M. Rödder, Shankar S. Iyer, S. Aur et al. · 2002 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +17