Concepedia
Statistics
Publications
15
Citations
1K
H-Index
12
Active since
1983
Affiliations
ASML (Netherlands)(Current)
Taiwan Semiconductor Manufacturing Company (Taiwan)
Vrije Universiteit Amsterdam
Advanced Research Center for Nanolithography (Netherlands)
Philips (Netherlands)
Arie den Boef is an author at ASML (Netherlands) specializing in engineering, optical properties, and applied physics.
Top concepts
EngineeringApplied PhysicsOptical PropertiesPhysicsPhotonicsOptoelectronicsMicroelectronicsOptical MaterialsMicroscopy3D Printing
Publications per year
1983–2022
Coherence collapse in single-mode semiconductor lasers due to optical feedback
D. Lenstra, B.H. Verbeek, Arie den Boef · IEEE Journal of Quantum Electronics · 1985 · 493 citations
Coherence Collapse, Quantum Science, Photonics +14
The influence of feedback intensity on longitudinal mode properties and optical noise in index-guided semiconductor lasers
G.A. Acket, D. Lenstra, Arie den Boef et al. · IEEE Journal of Quantum Electronics · 1984 · 252 citations
Optical Materials, Engineering, Laser Science +25
Low-frequency mode-hopping optical noise in AlGaAs channeled substrate lasers induced by optical feedback
J. Biesterbos, Arie den Boef, W. Linders et al. · IEEE Journal of Quantum Electronics · 1983 · 37 citations
Optical Pumping, Photonics, Engineering +12
Evaluation of a novel ultra small target technology supporting on-product overlay measurements
Henk-Jan H. Smilde, Arie den Boef, Michael Kubis et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2012 · 33 citations
Diffraction-based overlay metrology using angular-multiplexed acquisition of dark-field digital holograms
Christos Messinis, Theodorus T. M. van Schaijk, Nitesh Pandey et al. · Optics Express · 2020 · 27 citations · Full text
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