K. C. Hickman is an author at University of New Mexico specializing in ophthalmology, optical properties, and engineering.
Top concepts
EngineeringOphthalmologyOptoelectronicsOptical MaterialsOptical PropertiesGratingsMedicinePhotonicsMicroscopy3D Printing
Publications per year
1992–1992
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Linewidth measurement of gratings on photomasks: a simple technique
S. Sohail H. Naqvi, Susan M. Gaspar, K. C. Hickman et al. · Applied Optics · 1992 · 24 citations
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