Y. S. Tsai

Self-heating effect in FinFETs and its impact on devices reliability characterization

S. E. Liu, J. S. Wang, Ying-Ta Lu et al. · 2014 · 114 citations

Engineering, Electrical Engineering, Electronic Materials +15

Prediction of NBTI degradation for circuit under AC operation

Y. S. Tsai, Niraj K. Jha, Y.-H. Lee et al. · 2010 · 22 citations

Engineering, Electrical Engineering, Microelectronics +16

Consideration of BTI variability and product level reliability to expedite advanced FinFET process development

Y.-H. Lee, J H. Lee, Yih Wang et al. · 2016 · 20 citations

Engineering, Computer Engineering, Electrical Engineering +17

Comprehensive device and product level reliability studies on advanced CMOS technologies featuring 7nm high-k metal gate FinFET transistors

Dongsheng Huang, J. H. Lee, Y. S. Tsai et al. · 2018 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +17

The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs

I. K. Chen, S. C. Chen, Subhadeep Mukhopadhyay et al. · 2018 · 17 citations

Engineering, Electrical Engineering, Electronic Materials +16