Ivo de Jong

EUV lithography at chipmakers has started: performance validation of ASML's NXE:3100

Christian Wagner, Jose Bacelar, Noreen Harned et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2011 · 33 citations

Engineering, Manufacturing Engineering, Computer-integrated Manufacturing +13

From performance validation to volume introduction of ASML's NXE platform

H. Meiling, Wim de Boeij, Frank Bornebroek et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2012 · 27 citations

Engineering, Manufacturing Engineering, Microelectromechanical Systems +8

Hierarchical Test Sequencing for Complex Systems

R. Boumen, S. Ruan, Ivo de Jong et al. · IEEE Transactions on Systems Man and Cybernetics - Part A Systems and Humans · 2009 · 17 citations

Engineering, Manufacturing Engineering, Systems Engineering +6