Won-Chong Baek

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Active since

2006

Affiliations

ON Semiconductor (United States)(Current)

Won-Chong Baek is an author at ON Semiconductor (United States) specializing in interconnect technology, metallic materials, and interconnect reliability.

Publications per year

2006–2010

Publications

Electromigration-Induced Plastic Deformation in Cu Interconnects: Effects on Current Density Exponent, n, and Implications for EM Reliability Assessment

Arief Suriadi Budiman, Christine Hau-Riege, Won-Chong Baek et al. · Journal of Electronic Materials · 2010 · 46 citations · Full text

Natural Sciences, Electrical Engineering, Materials Science +17

Effect of barrier process on electromigration reliability of Cu/porous low-k interconnects

Jung Woo Pyun, Won-Chong Baek, Jay Im et al. · Journal of Applied Physics · 2006 · 13 citations

Engineering, Electrical Engineering, Materials Science +17

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