Johan Loeckx

Emerging yield and reliability challenges in nanometer CMOS technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 · 119 citations

Engineering, Computer Engineering, Electrical Engineering +17

Blurring Boundaries in Education: Context and Impact of MOOCs

Johan Loeckx · The International Review of Research in Open and Distributed Learning · 2016 · 85 citations · Full text

Education, Educational Technology, Teaching +14

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 Design, Automation and Test in Europe · 2008 · 60 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Assessment of the DPI Standard for Immunity Simulation of Integrated Circuits

Johan Loeckx, Georges Gielen · 2007 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +14

Efficient identification of major contributions to EMI-induced rectification effects in analog automotive circuits

Johan Loeckx, Georges Gielen · 2006 · 12 citations

Engineering, Automotive Engineering, Electrical Engineering +17