D. Maji

$1/f$ Noise in Drain and Gate Current of MOSFETs With High-$k$ Gate Stacks

Paolo Magnone, Felice Crupi, Gino Giusi et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 124 citations · Full text

Gate Stacks, Gate Dielectrics, Electrical Engineering +13

Effect of Cr3+ substitution on the magnetic and dielectric properties of cobalt ferrites

Sikha Sarmah, D. Maji, S. Ravi et al. · Journal of Alloys and Compounds · 2023 · 33 citations

Materials Science, Magnetism, Magnetic Properties +8

Effect of rare earth (Ho and Er) co-substitution on the magnetic and dielectric properties of nanocrystalline cobalt ferrites

O. Manner, Shilpi Sarmah, K Pushpanjali Patra et al. · Ceramics International · 2024 · 28 citations

Materials Science, Magnetism, Ferromagnetism +10

Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs

D. Maji, Felice Crupi, E. Amat et al. · IEEE Transactions on Electron Devices · 2009 · 22 citations

Reliability, Electrical Engineering, Reliability Engineering +14

On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN∕TaN∕HfO2∕SiO2 gate stack

D. Maji, Felice Crupi, Gino Giusi et al. · Applied Physics Letters · 2008 · 18 citations

Semiconductor Technology, Tin∕tan∕hfo2∕sio2 Gate Stack, Electrical Engineering +11