J. Kanatharana

Determination of crystal misorientation in epitaxial lateral overgrowth of GaN

W.M. Chen, P.J. McNally, K. Jacobs et al. · Journal of Crystal Growth · 2002 · 18 citations

Wide-bandgap Semiconductor, Epitaxial Growth, Physics +4

Mapping of mechanical stresses in silicon substrates due to lead tin solder bump reflow process via synchrotron x-ray topography and finite element modelling

J. Kanatharana, J J P rez-Camacho, T. Buckley et al. · Journal of Physics D Applied Physics · 2003 · 17 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +23

Synchrotron X-ray topography of undoped VCz GaAs crystals

T. Tuomi, L. Knuuttila, Juha Riikonen et al. · Journal of Crystal Growth · 2002 · 17 citations

Engineering, Physics, X-ray Diffraction +6

Evaluation of mechanical stresses in silicon substrates due to lead–tin solder bumps via synchrotron X-ray topography and finite element modeling

J. Kanatharana, J.J. Pérez-Camacho, T. Buckley et al. · Microelectronic Engineering · 2002 · 15 citations

Materials Science, Engineering, Severe Plastic Deformation +10

Quality Assessment of Sapphire Wafers for X-Ray Crystal Optics Using White Beam Synchrotron X-Ray Topography

W.M. Chen, P.J. McNally, Yuri Shvyd’ko et al. · physica status solidi (a) · 2001 · 14 citations

Engineering, X-ray Spectroscopy, Synchrotron Radiation Source +17