Ann Koo

A Low-Temperature Microwave Anneal Process for Boron-Doped Ultrathin Ge Epilayer on Si Substrate

Yao‐Jen Lee, Fu-Kuo Hsueh, Shih‐Chiang Huang et al. · IEEE Electron Device Letters · 2008 · 24 citations

Engineering, Electrical Engineering, Materials Science +17

Resistive switching behavior in a Ni–Ag2Se–Ni nanowire

N. J. Lee, Boo Hyun An, Ann Koo et al. · Applied Physics A · 2011 · 20 citations

Natural Sciences, Materials Science, Physics +10

Novel noncontact thickness metrology for backend manufacturing of wide bandgap light emitting devices

Wojtek J. Walecki, Kevin Lai, Vitalij Souchkov et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 2005 · 15 citations

Engineering, Materials Engineering, Materials Science +16

Low-coherence interferometric absolute distance gauge for study of MEMS structures

W. J. Walecki, Kevin Lai, Alexander Pravdivtsev et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 15 citations

Engineering, Materials Science, Metrology +16

Novel low coherence metrology for nondestructive characterization of high-aspect-ratio microfabricated and micromachined structures

W. J. Walecki, Frank Wei, Phuc Van et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 12 citations

Engineering, Materials Engineering, Materials Science +17