Richard Chapman - Concepedia

Author

Richard Chapman

North Carolina State University

Also Known As

R. C. Chapman, R. Chapman, Richard C. Chapman, Richard Chapman

Publications

125

Citations

H-Index

Concepts

All Affiliations

North Carolina State University MCNC Research and Development Institute

About

Richard Chapman is an author at North Carolina State University specializing in engineering, applied physics, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	113
2	Applied Physics	4	4	77
3	Natural Sciences	1	1	13
4	Chemical Engineering	1	1	15
5	Chemistry	1	1	15

Richard Chapman

Publications

113

Citations

H-Index

Page 1

	Year	Citations
Improved stability of thin cobalt disilicide films using BF2 implantation Q. F. Wang, J. Y. Tsai, C. M. Osburn, Applied Physics Letters Materials EngineeringMaterials ScienceMaterial AnalysisEngineeringBf2 Implantation	1992	24
Model and simulation of scanning tunneling microscope tip/semiconductor interactions in <i>p</i> <i>n</i> junction delineation Richard Chapman, M. Kellam, Scott H. Goodwin-Johansson, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena SemiconductorsSemiconductor TechnologyElectrical EngineeringEngineeringTunneling Probability	1992	21
Intelligible Crosstalk Between Frequency Modulated Carrers Through AM-PM Conversion Richard Chapman, J. K. Millard IRE Transactions on Communications Systems Wireless CommunicationsEngineeringAnalog DesignAm-pm ConversionTransmission System	1964	21
Scanning tunneling microscopy and spectroscopy of <i>p</i> <i>n</i> junctions formed by ion implantation John V. Labrasca, Richard Chapman, G. E. McGuire, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyNative OxideOptoelectronic DevicesPn Junction	1991	19
A Prophetic CO2 Corrosion Tool – but When Is It to Be Believed? Bill Hedges, Richard Chapman, Don Harrop, Materials ScienceCorrosion TechnologyChemical EngineeringOil WettingEngineering	2005	15
Use of scanning tunneling microscopy and transmission electron microscopy to quantify and characterize CoSi2 roughness Richard Chapman, P.A. Smith, R. P. Adu, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringTransmission Electron MicroscopyMicroscopyRoughness ValuesInterface Roughness	1992	13

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