Richard Chapman

Improved stability of thin cobalt disilicide films using BF2 implantation

Q. F. Wang, J. Y. Tsai, C. M. Osburn et al. · Applied Physics Letters · 1992 · 24 citations

Engineering, Materials Engineering, Materials Science +16

Model and simulation of scanning tunneling microscope tip/semiconductor interactions in <i>p</i> <i>n</i> junction delineation

Richard Chapman, M. Kellam, Scott H. Goodwin-Johansson et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1992 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

Intelligible Crosstalk Between Frequency Modulated Carrers Through AM-PM Conversion

Richard Chapman, J. K. Millard · IRE Transactions on Communications Systems · 1964 · 21 citations

Engineering, Communication, Electrical Engineering +14

Scanning tunneling microscopy and spectroscopy of <i>p</i> <i>n</i> junctions formed by ion implantation

John V. Labrasca, Richard Chapman, G. E. McGuire et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 19 citations

Engineering, Materials Engineering, Materials Science +17

A Prophetic CO2 Corrosion Tool – but When Is It to Be Believed?

Bill Hedges, Richard Chapman, Don Harrop et al. · 2005 · 15 citations

Engineering, Chemical Engineering, Materials Science +17