Kees Beenakker

Test Cost Analysis for 3D Die-to-Wafer Stacking

Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker et al. · 2010 · 54 citations

Engineering, Test Flow, Computer Architecture +19

Dependence of Single-Crystalline Si TFT Characteristics on the Channel Position Inside a Location-Controlled Grain

Vikas Rana, Ryoichi Ishihara, Yasushi Hiroshima et al. · IEEE Transactions on Electron Devices · 2005 · 46 citations

Electrical Engineering, Engineering, Location-controlled Grain +13

Effects of Capping Layer on Grain Growth with µ-Czochralski Process during Excimer Laser Crystallization

Ming He, Ryoichi Ishihara, Yasushi Hiroshima et al. · Japanese Journal of Applied Physics · 2006 · 34 citations

Optical Materials, Engineering, Crystal Growth Technology +18

Agglomeration of amorphous silicon film with high energy density excimer laser irradiation

Ming He, Ryoichi Ishihara, Wim Metselaar et al. · Thin Solid Films · 2006 · 33 citations

Materials Science, Advanced Laser Processing, Engineering +9

Size-Dependent Effects on the Temperature Coefficient of Resistance of Carbon Nanotube Vias

Sten Vollebregt, Sourish Banerjee, Kees Beenakker et al. · IEEE Transactions on Electron Devices · 2013 · 26 citations

Electrical Resistance, Engineering, Carbon Nanotechnology +23