Concepedia

Author

Frédéric Barbier

Commissariat à l'Énergie Atomique et aux Énergies Alternatives

Also Known As

F Barbier, F. Barbier, Frederic Barbier, Frédéric Barbier, Jourdan, J.

23

Publications

344

Citations

10

H-Index

30

Concepts

All Affiliations

Commissariat à l'Énergie Atomique et aux Énergies AlternativesLaboratoire d'Électronique des Technologies de l'InformationUniversité Grenoble AlpesCEA GrenobleInstitut polytechnique de Grenoble
FB

About

Frédéric Barbier is an author at Commissariat à l'Énergie Atomique et aux Énergies Alternatives specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

7

7

211

2

Applied Physics

6

6

199

3

Electrical Engineering

5

5

170

4

Natural Sciences

1

1

19

5

Chemistry

1

1

19

Frédéric Barbier

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9

Publications

304

Citations

9

H-Index

YearCitations

Full InGaN red light emitting diodes

A. Dussaigne, Frédéric Barbier, B. Damilano,

Journal of Applied Physics

2020

73

Full InGaN red (625 nm) micro-LED (10 μm) demonstration on a relaxed pseudo-substrate

A. Dussaigne, Patrick Le Maître, Helge Haas,

Applied Physics Express

2021

73

Fully Optimized Cu based process with dedicated cavity etch for 1.75μm and 1.45μm pixel pitch CMOS Image Sensors

Muriel Cohen, F. Roy, Didier Hérault,

2006

45

Strongly reduced V pit density on InGaNOS substrate by using InGaN/GaN superlattice

A. Dussaigne, Frédéric Barbier, B. Samuel,

Journal of Crystal Growth

2020

26

Determination of the internal piezoelectric potentials and indium concentration in InGaN based quantum wells grown on relaxed InGaN pseudo-substrates by off-axis electron holography

David Cooper, Victor Boureau, A. Even,

Nanotechnology

2020

21

Back Illuminated Vertically Pinned Photodiode with in Depth Charge Storage

Julien Michelot, F. Roy, Jens Prima,

IISS online library

2024

20

Three-dimensional measurement of Mg dopant distribution and electrical activity in GaN by correlative atom probe tomography and off-axis electron holography

Lynda Amichi, Isabelle Mouton, Enrico Di Russo,

Journal of Applied Physics

2020

19

Origins of nanoscale emission inhomogeneities of high content red emitting InGaN/InGaN quantum wells

B. Samuel, David Cooper, N. Rochat,

Journal of Applied Physics

2021

15

Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method

Jean Luc Lefebvre, Christian Gautier, Frédéric Barbier

Microelectronics Reliability

2009

12

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