Kuen-Yi Chen

Impact of Plasma Treatment on Reliability Performance for HfZrO_x-Based Metal-Ferroelectric-Metal Capacitors

Kuen-Yi Chen, Pin‐Hsuan Chen, Ruei-Wen Kao et al. · IEEE Electron Device Letters · 2017 · 84 citations

Natural Sciences, Materials Engineering, Materials Science +17

FeFET Memory Featuring Large Memory Window and Robust Endurance of Long-Pulse Cycling by Interface Engineering using High-k AlON

Chi-Yu Chan, Kuen-Yi Chen, Hao‐Kai Peng et al. · 2020 · 73 citations

Engineering, Electrical Engineering, Materials Science +13

Enabling large memory window and high reliability for FeFET memory by integrating AlON interfacial layer

Hao‐Kai Peng, Chi-Yu Chan, Kuen-Yi Chen et al. · Applied Physics Letters · 2021 · 66 citations

Engineering, Electrical Engineering, Materials Science +17

Ionizing Radiation Effect on Memory Characteristics for HfO₂-Based Ferroelectric Field-Effect Transistors

Kuen-Yi Chen, Yi‐Shan Tsai, Yung‐Hsien Wu · IEEE Electron Device Letters · 2019 · 33 citations

Engineering, Electrical Engineering, Microelectronics +9

Ferroelectricity of low thermal-budget HfAlO_x for devices with metal–ferroelectric–insulator–semiconductor structure

Kuen-Yi Chen, Ka-Lip Chu, Pin‐Hsuan Chen et al. · RSC Advances · 2016 · 29 citations

Natural Sciences, Materials Science, Physics +12