I. A. Kharitonov

International key comparison of measurements of neutron source emission rate (1999–2005): CCRI(III)-K9.AmBe

Neil Roberts, L. N. Jones, Zhilan Wang et al. · Metrologia · 2011 · 26 citations

Natural Sciences, Nuclear Engineering, Nuclear Chemistry +11

SOI device parameter investigation and extraction for VLSI radiation hardness modeling with SPICE

Konstantin O. Petrosjanc, I. A. Kharitonov, Maria V. Sicheva · 2002 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +17

International key comparison of neutron fluence measurements in mono-energetic neutron fields: CCRI(III)-K10

J Chen, Z Wang, Chaoying Rong et al. · Metrologia · 2007 · 17 citations

Engineering, Nuclear Engineering, Physics +16

Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C)

Konstantin O. Petrosyants, I. A. Kharitonov, S. V. Lebedev et al. · Microelectronics Reliability · 2017 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +16

Automation of parameter extraction procedure for Si JFET SPICE model in the −200…+110°C temperature range

Konstantin O. Petrosyants, Mamed R. Ismail-zade, Lev M. Sambursky et al. · 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT) · 2018 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +13