Fredrik Owman

High-resolution core-level study of 6<i>H</i>-SiC(0001)

L. I. Johansson, Fredrik Owman, Per Mårtensson · Physical review. B, Condensed matter · 1996 · 195 citations

Materials Science, Surface Characterization, Optical Materials +15

STM study of the SiC(0001) √3 × √3 surface

Fredrik Owman, Per Mårtensson · Surface Science · 1995 · 134 citations

Engineering, Physics, Surface Analysis +4

Removal of polishing-induced damage from 6H-SiC(0001) substrates by hydrogen etching

Fredrik Owman, C. Hallin, Per Mårtensson et al. · Journal of Crystal Growth · 1996 · 122 citations

Materials Science, Materials Engineering, Engineering +10

In situ substrate preparation for high-quality SiC chemical vapour deposition

C. Hallin, Fredrik Owman, Per Mårtensson et al. · Journal of Crystal Growth · 1997 · 117 citations

Materials Science, Materials Engineering, Engineering +8

Morphology, Atomic and Electronic Structure of 6H-SiC(0001) Surfaces

P. M�rtensson, Fredrik Owman, L. I. Johansson · physica status solidi (b) · 1997 · 108 citations

Materials Science, Semiconductors, Surface Characterization +13