F.P. Heiler

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Active since

1993

Affiliations

Advanced Micro Devices (United States)(Current)

F.P. Heiler is an author at Advanced Micro Devices (United States) specializing in device reliability, microelectronics, and metal-oxide-semiconductor field-effect transistors.

Publications per year

1993–1994

Publications

Process induced oxide damage and its implications to device reliability of submicron transistors

R. Rakkhit, F.P. Heiler, Peng Fang et al. · 1993 · 34 citations

Engineering, Electrical Engineering, Materials Science +17

Characterization and optimization of metal etch processes to minimize charging damage to submicron transistor gate oxide

M.-R. Lin, Peng Fang, F.P. Heiler et al. · IEEE Electron Device Letters · 1994 · 16 citations

Engineering, Electrical Engineering, Materials Science +14

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