C.H. Kim

Impact of NBTI on SRAM Read Stability and Design for Reliability

Sanjay V. Kumar, C.H. Kim, Sachin S. Sapatnekar · 2006 · 310 citations

Non-volatile Memory, Engineering, Sram Read Stability +16

Gate leakage reduction for scaled devices using transistor stacking

Subhas Chandra Mukhopadhyay, C. Neau, Riza Tamer Cakici et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2003 · 153 citations

Hardware Security, Device Modeling, Electrical Engineering +11

A forward body-biased low-leakage SRAM cache: device, circuit and architecture considerations

C.H. Kim, Jae‐Joon Kim, Saibal Mukhopadhyay et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2005 · 88 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +12

Leakage power analysis and reduction: models, estimation and tools

Amit Agarwal, Saibal Mukhopadhyay, C.H. Kim et al. · IEE Proceedings - Computers and Digital Techniques · 2005 · 67 citations

Engineering, Power Optimization (Eda), Side-channel Attack +17

Utilizing Reverse Short-Channel Effect for Optimal Subthreshold Circuit Design

Tae-Hyoung Kim, John Keane, Hanyong Eom et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2007 · 60 citations · Full text

Device Modeling, Low-power Electronics, Electrical Engineering +14