Edward Namkyu Cho

Analysis of Bias Stress Instability in Amorphous InGaZnO Thin-Film Transistors

Edward Namkyu Cho, Jung Han Kang, Chang-Eun Kim et al. · IEEE Transactions on Device and Materials Reliability · 2010 · 120 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +15

Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors

Edward Namkyu Cho, Jung Han Kang, Ilgu Yun · Microelectronics Reliability · 2011 · 58 citations

Electrical Engineering, Engineering, Channel Thickness Variation +6

Mobility enhancement in amorphous InGaZnO thin-film transistors by Ar plasma treatment

Jung Han Kang, Edward Namkyu Cho, Chang-Eun Kim et al. · Applied Physics Letters · 2013 · 57 citations

Materials Science, Electrical Engineering, Engineering +13

Contact resistance dependent scaling-down behavior of amorphous InGaZnO thin-film transistors

Edward Namkyu Cho, Jung Han Kang, Ilgu Yun · Current Applied Physics · 2011 · 52 citations

Materials Science, Electrical Engineering, Engineering +4

Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm

Edward Namkyu Cho, Pyung Moon, Chang-Eun Kim et al. · Expert Systems with Applications · 2012 · 24 citations

Materials Engineering, Materials Science, Electrical Engineering +8