Statistics
Publications
8
Citations
180
H-Index
8
Active since
1967
R. P. Donovan is an author at RTI International specializing in materials science, engineering, and semiconductor devices.
Publications per year
1967–1993
8
8
The Effects of Contamination on Semiconductor Manufacturing Yield
C. M. Osburn, Henry Berger, R. P. Donovan et al. · Journal of the IEST · 1988 · 27 citations
Engineering, Manufacturing Engineering, Materials Science +17
Particle Size Distributions in Clean Rooms
David Ensor, R. P. Donovan, Bruce R. Locke · Journal of the IEST · 1987 · 14 citations
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