Concepedia

Giacomo Barletta

GB

Statistics

Publications

2

Citations

34

H-Index

2

Active since

2005

Affiliations

STMicroelectronics (Italy)(Current)

Giacomo Barletta is an author at STMicroelectronics (Italy) specializing in microelectronics, semiconductor reliability, and reliability degradation.

ORCID

Publications per year

2005–2014

2

Publications

2

Negative Bias Temperature Stress Reliability in Trench-Gated P-Channel Power MOSFETs

Andrea Natale Tallarico, Paolo Magnone, Giacomo Barletta et al. · IEEE Transactions on Device and Materials Reliability · 2014 · 21 citations

, , +17

Junction leakage current degradation under high temperature reverse-bias stress induced by band-defect-band tunnelling in power VDMOS

Giacomo Barletta, Giuseppe Currò · Microelectronics Reliability · 2005 · 13 citations

, , +17

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