V. D. Maheta

A critical re-evaluation of the usefulness of R-D framework in predicting NBTI stress and recovery

Souvik Mahapatra, Ahmad E. Islam, S. Deora et al. · 2011 · 104 citations

Engineering, Mechanical Engineering, Nbti Stress +17

Isolation of NBTI Stress Generated Interface Trap and Hole-Trapping Components in PNO p-MOSFETs

Souvik Mahapatra, V. D. Maheta, Ahmad E. Islam et al. · IEEE Transactions on Electron Devices · 2009 · 69 citations

Isolation Technique, Engineering, Nbti Stress +16

Material Dependence of NBTI Physical Mechanism in Silicon Oxynitride (SiON) p-MOSFETs: A Comprehensive Study by Ultra-Fast On-The-Fly (UF-OTF) I<inf>DLIN</inf> Technique

E. N. Kumar, V. D. Maheta, S. Purawat et al. · 2007 · 55 citations

Engineering, Nbti Physical Mechanism, Material Dependence +17

The Impact of Nitrogen Engineering in Silicon Oxynitride Gate Dielectric on Negative-Bias Temperature Instability of p-MOSFETs: A Study by Ultrafast On-The-Fly $I_{\rm DLIN}$ Technique

V. D. Maheta, Christopher S. Olsen, Khaled Ahmed et al. · IEEE Transactions on Electron Devices · 2008 · 47 citations

Semiconductors, \Rm Dlin, Electrical Engineering +14

Mobility degradation due to interface traps in plasma oxynitride PMOS devices

Ahmad E. Islam, V. D. Maheta, Hitesh Das et al. · 2008 · 45 citations

Electrical Engineering, Engineering, Oxide Electronics +8