Andrew J. Trunek

Growth of step-free surfaces on device-size (0001)SiC mesas

J. A. Powell, Philip G. Neudeck, Andrew J. Trunek et al. · Applied Physics Letters · 2000 · 100 citations

Engineering, Materials Engineering, Materials Science +17

CVD Growth of 3C‐SiC on 4H/6H Mesas

Philip G. Neudeck, Andrew J. Trunek, David J. Spry et al. · Chemical Vapor Deposition · 2006 · 63 citations

Natural Sciences, Materials Engineering, Materials Science +17

Nondestructive analysis of threading dislocations in GaN by electron channeling contrast imaging

Yoosuf N. Picard, Joshua D. Caldwell, M. E. Twigg et al. · Applied Physics Letters · 2007 · 55 citations

Engineering, Materials Engineering, Materials Science +17

Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC

Yoosuf N. Picard, M. E. Twigg, Joshua D. Caldwell et al. · Applied Physics Letters · 2007 · 44 citations

Natural Sciences, Materials Science, Physics +17

Development of SiC-based Gas Sensors for Aerospace Applications

Gary W. Hunter, Philip G. Neudeck, Jennifer Xu et al. · MRS Proceedings · 2004 · 40 citations

Engineering, Aerospace Engineering, Materials Science +11