Concepedia

James M. Puhl

JM

14

Publications

631

Citations

12

H-Index

1993

Active since

Affiliations

National Institute of Standards and Technology(Current)

Vanderbilt University

Hungarian Academy of Sciences

James M. Puhl is an author at National Institute of Standards and Technology specializing in dosimetry, engineering, and radiation oncology.

Top concepts

DosimetryEngineeringInstrumentationRadiation OncologyMedicineNuclear MedicineRadiation DoseHealthRadiologyApplied Physics

Publications per year

1993–2009

14

Publications

14

Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures

S.C. Witczak, Ronald D. Schrimpf, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 1997 · 132 citations

Engineering, Radiation Effect, Radiation Exposure +19

Novel Radiochromic Films for Clinical Dosimetry

W.L. McLaughlin, James M. Puhl, Mohamad Al‐Sheikhly et al. · Radiation Protection Dosimetry · 1996 · 92 citations

Advancements in accuracy of the alanine dosimetry system. Part 2. The influence of the irradiation temperature

Vitaly Nagy, James M. Puhl, Marc F. Desrosiers · Radiation Physics and Chemistry · 2000 · 75 citations

Radiation Detection, Measurement, Calibration +11

ACCELERATED TESTS FOR SIMULATING LOW DOSE RATE GAIN DEGRADATION OF LATERAL AND SUBSTRATE PNP BIPOLAR JUNCTION TRANSISTORS

S.C. Witczak, Ronald D. Schrimpf, K.F. Galloway et al. · IEEE Transactions on Nuclear Science · 1996 · 67 citations

Engineering, Radiation Effect, Radiation Exposure +16

Gain degradation of lateral and substrate pnp bipolar junction transistors

S.C. Witczak, Ronald D. Schrimpf, K.F. Galloway et al. · IEEE Transactions on Nuclear Science · 1996 · 58 citations

Electrical Engineering, Base Oxide, Engineering +15

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