Concepedia

T. Kouno

TK

4

Publications

78

Citations

4

H-Index

1998

Active since

Affiliations

Fujitsu (Japan)(Current)

T. Kouno is an author at Fujitsu (Japan) specializing in engineering, materials science, and applied physics.

Top concepts

EngineeringApplied PhysicsMaterial ScienceMicrostructureMicroelectronicsElectronic PackagingMaterials EngineeringElectrical EngineeringCorrosionMechanics Of Materials

Publications per year

1998–2008

4

Publications

4

Effect of TiN Microstructure on Diffusion Barrier Properties in Cu Metallization

T. Kouno, Hideo Niwa, Masao Yamada · Journal of The Electrochemical Society · 1998 · 34 citations

Engineering, Diffusion Barrier Properties, Thin Film Process Technology +20

Stress migration phenomenon in narrow copper interconnects

Takashi Suzuki, T. Nakamura, Y. Mizushima et al. · Journal of Applied Physics · 2007 · 18 citations · Full text

Engineering, Severe Plastic Deformation, Residual Stress +17

Effect of Al3Ti intermetallic compound on electromigration lifetime of Al alloy interconnections

T. Kouno, Mariko Hosaka, H. Niwa et al. · Journal of Applied Physics · 1998 · 15 citations

Aluminium Nitride, Engineering, Interconnect (Integrated Circuits) +17

Investigation of stress-induced voiding inside and under VIAS in copper interconnects with &#x201C;wing&#x201D; pattern

Hideya Matsuyama, Takashi Suzuki, H. Ehara et al. · 2008 · 11 citations

Engineering, Residual Stress, Stress Gradient +19

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