Satoshi Ohtake

A non-scan DFT method at register-transfer level to achieve complete fault efficiency

Satoshi Ohtake, Hiroki Wada, Toshimitsu Masuzawa et al. · 2000 · 32 citations

Engineering, Register-transfer Level, Computer Architecture +24

A circuit failure prediction mechanism (DART) for high field reliability

Yasuo Satô, Seiji Kajihara, Yukiya Miura et al. · 2009 · 31 citations

Reliability, Electrical Engineering, Reliability Engineering +13

Design for Testability of Software-Based Self-Test for Processors

Masato Nakazato, Satoshi Ohtake, Michiko Inoue et al. · Proceedings - Asian Test Symposium/Proceedings · 2006 · 26 citations

Test Program Templates, Engineering, Computer Architecture +17

Effects of visual information on auditory presence.

Kenji Ozawa, Satoshi Ohtake, Yôiti Suzuki et al. · Nippon Onkyo Gakkaishi/Acoustical science and technology/Nihon Onkyo Gakkaishi · 2003 · 23 citations · Full text

Auditory Processing, Auditory Imagery, Cognitive Science +4

Low-Cost Hardening of Image Processing Applications Against Soft Errors

Ilia Polian, Bernd Becker, Masato Nakasato et al. · 2006 · 22 citations

Hardware Security, Image Processing Systems, Image Analysis +14