J. Woitok

Dislocation density assessment via X‐ray GaN rocking curve scans

Ian D. Booker, L. Rahimzadeh Khoshroo, J. Woitok et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 2010 · 31 citations

Materials Science, Dislocation Densities, Engineering +15

Molecular beam epitaxy and characterization of heterostructures for magnetic sensing applications

M. Behet, Štefan Németh, J. De Boeck et al. · Semiconductor Science and Technology · 1998 · 23 citations

Engineering, Magnetic Resonance, Magnetoresistance +17

Characterization of the interface abruptness of In0.53Ga0.47As/InP multi quantum wells by Raman spectroscopy, X-ray diffractometry and photoluminescence

J. Geurts, Jo Finders, J. Woitok et al. · Journal of Crystal Growth · 1994 · 21 citations

Materials Science, Wide-bandgap Semiconductor, Ii-vi Semiconductor +10

Effect of indium incorporation on optical and structural properties of m-plane InGaN/GaN MQW on LiAlO2 substrates

C. Mauder, B. Reuters, K.R. Wang et al. · Journal of Crystal Growth · 2010 · 15 citations

Materials Science, Wide-bandgap Semiconductor, Optical Materials +10

Development of m-plane GaN anisotropic film properties during MOVPE growth on LiAlO2 substrates

C. Mauder, B. Reuters, L. Rahimzadeh Khoshroo et al. · Journal of Crystal Growth · 2010 · 15 citations

Materials Science, Wide-bandgap Semiconductor, Engineering +8