J. Geurts

SnO films and their oxidation to SnO2: Raman scattering, IR reflectivity and X-ray diffraction studies

J. Geurts, S. Rau, W. Richter et al. · Thin Solid Films · 1984 · 299 citations

Materials Science, Surface Characterization, Material Analysis +8

Bias-induced threshold voltages shifts in thin-film organic transistors

Henrique L. Gomes, Peter Stallinga, Franco Dinelli et al. · Applied Physics Letters · 2004 · 198 citations · Full text

Bias-induced Threshold Voltages, Engineering, Organic Electronics +16

Kinetic Exchange between the Conduction Band Electrons and Magnetic Ions in Quantum-Confined Structures

I. A. Merkulov, D. R. Yakovlev, Andreas Keller et al. · Physical Review Letters · 1999 · 117 citations

Categoryquantum Electronics, Engineering, Conduction Band Electrons +21

Effect of Hydrostatic and Uniaxial Pressure on Structural Properties and Raman Active Lattice Vibrations in Bi₂Te₃

W Kullmann, J. Geurts, W. Richter et al. · physica status solidi (b) · 1984 · 108 citations

Engineering, Physical Property, Hexagonal Unit Cell +18

In situ electrical characterization of DH4T field-effect transistors

T. Muck, V. Wagner, U. Bass et al. · Synthetic Metals · 2004 · 90 citations

Electrical Engineering, Engineering, Situ Electrical Characterization +2