T. Muck

Bias-induced threshold voltages shifts in thin-film organic transistors

Henrique L. Gomes, Peter Stallinga, Franco Dinelli et al. · Applied Physics Letters · 2004 · 198 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

In situ electrical characterization of DH4T field-effect transistors

T. Muck, V. Wagner, U. Bass et al. · Synthetic Metals · 2004 · 90 citations

Engineering, Electrical Engineering, Materials Science +11

Organic thin-film transistors fabricated by microcontact printing

M. Leufgen, A. Lebib, T. Muck et al. · Applied Physics Letters · 2004 · 66 citations

Engineering, Electrical Engineering, Materials Science +17

Influence of impurities and structural properties on the device stability of pentacene thin film transistors

Dietmar Knipp, Amare Benor, V. Wagner et al. · Journal of Applied Physics · 2007 · 63 citations

Engineering, Materials Engineering, Materials Science +17

Better bottom contact properties in organic field-effect transistors with ultrathin layers

T. Muck, J. Fritz, V. Wagner · Applied Physics Letters · 2005 · 47 citations

Engineering, Materials Engineering, Materials Science +17