Jaroslav Jiruše

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with<i>In Situ</i>AFM

J. A. Whitby, Fredrik Östlund, Péter Horváth et al. · Advances in Materials Science and Engineering · 2011 · 81 citations · Full text

Microscopy, Biological Mass Spectrometry, Ion Beam Instrumentation +17

Structure and dynamics of the Al(110) surface

Anders Mikkelsen, Jaroslav Jiruše, D. L. Adams · Physical review. B, Condensed matter · 1999 · 23 citations

Aluminium Nitride, Engineering, Multilayer Relaxations +16

FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources

F. A. Stevie, L. Sedláček, Petr Bábor et al. · Surface and Interface Analysis · 2014 · 17 citations

Ion Implantation, Engineering, Fib‐sims Quantification +10

Combined plasma FIB-SEM

Jaroslav Jiruše, Tomáš Hrnčíř, F. Lopour et al. · Microscopy and Microanalysis · 2012 · 14 citations

Engineering, Physics, Microscopy +12

Integrating focused ion beam–scanning electron microscope with confocal Raman microscope into a single instrument

Jaroslav Jiruše, Martin Haničinec, Miloslav Havelka et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2014 · 13 citations

Materials Science, Single Instrument, Engineering +15