M. Zadražil

The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison

C.G.H. Walker, M. El‐Gomati, A. M. D. Assa’d et al. · Scanning · 2008 · 138 citations

Engineering, Range 250–5000, Electron Diffraction +17

Theory Experiment Comparison of the Electron Backscattering Factor from Solids at Low Electron Energy (250–5,000 eV)

M. M. El Gomati, C.G.H. Walker, A. M. D. Assa’d et al. · Scanning · 2008 · 83 citations

Scanning electron microscopy of nonconductive specimens at critical energies in a cathode lens system

L. Frank, M. Zadražil, Ilona Müllerová · Scanning · 2001 · 24 citations

Electron Backscattering from Real and In-Situ Treated Surfaces

L. Frank, Richard Steklý, M. Zadražil et al. · Microchimica Acta · 2000 · 19 citations

Materials Science, Engineering, Electron Backscattering +5

Novel Plasma FIB/SEM for High Speed Failure Analysis and Real Time Imaging of Large Volume Removal

Tomáš Hrnčíř, F. Lopour, M. Zadražil et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2012 · 17 citations

Materials Science, Electrical Engineering, Ion Implantation +14