F. Lopour

Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling

Yoosuf N. Picard, Ranga Kamaladasa, Marc De Graef et al. · Microscopy Today · 2012 · 31 citations · Full text

Future Prospects, Engineering, Microscopy +23

High Speed TEM Sample Preparation by Xe FIB

Anne Delobbe, Olivier Salord, Tomáš Hrnčíř et al. · Microscopy and Microanalysis · 2014 · 21 citations · Full text

Materials Engineering, Materials Science, Xe Fib +8

Novel Plasma FIB/SEM for High Speed Failure Analysis and Real Time Imaging of Large Volume Removal

Tomáš Hrnčíř, F. Lopour, M. Zadražil et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2012 · 17 citations

Materials Science, Electrical Engineering, Ion Implantation +14

Combined plasma FIB-SEM

Jaroslav Jiruše, Tomáš Hrnčíř, F. Lopour et al. · Microscopy and Microanalysis · 2012 · 14 citations

Engineering, Physics, Microscopy +12

Novel field emission SEM column with beam deceleration technology

Jaroslav Jiruše, Miloslav Havelka, F. Lopour · Ultramicroscopy · 2014 · 12 citations

Accelerator Technology, Electrical Engineering, Beam Deceleration Technology +5