Denis Dontsov - Concepedia

Author

Denis Dontsov

Faseroptische Systeme Messtechnik (Germany)ORCID

Also Known As

D Dontsov, D. Dontsov, Denis Dontsov, Dennis Dontsov

Publications

519

Citations

H-Index

Concepts

All Affiliations

Faseroptische Systeme Messtechnik (Germany)Technische Universität Ilmenau Physikalisch-Technische Bundesanstalt Institut für Mikroelektronik- und Mechatronik-Systeme

About

Denis Dontsov is an author at Faseroptische Systeme Messtechnik (Germany) specializing in engineering, applied physics, and microfabrication.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	11	482
2	Applied Physics	9	9	403
3	Education	4	4	93
4	Business	1	1	26
5	Medicine	1	1	53

Denis Dontsov

Publications

482

Citations

H-Index

Page 1

	Year	Citations
Piezoelectric properties of polycrystalline AlN thin films for MEMS application Katja Tonisch, V. Cimalla, Ch. Foerster, Sensors and Actuators A Physical Materials ScienceElectrical EngineeringEngineeringApplied PhysicsPiezoelectric Properties	2006	202
Plasmonic Nanosensor Array for Multiplexed DNA-based Pathogen Detection David Zopf, Angelina Pittner, André Dathe, ACS Sensors NanomedicineNanosensorsPlasmonic NanoparticleEngineeringNanobiotechnology	2019	53
Progress of nanopositioning and nanomeasuring machines for cross-scale measurement with sub-nanometre precision Eberhard Manske, Thomas Fröhlich, Roland Füßl, Measurement Science and Technology Frequency MetrologyEngineeringMicroscopyMechanical EngineeringInterferometry	2020	46
Interference signal demodulation for nanopositioning and nanomeasuring machines Tino Hausotte, B Percle, Uwe Gerhardt, Measurement Science and Technology EngineeringMeasurementMicroscopyInterferometryOptical Metrology	2012	42
Piezoelectric properties of thin AlN layers for MEMS application determined by piezoresponse force microscopy Katja Tonisch, V. Cimalla, Ch. Foerster, Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics Aluminium NitrideEngineeringPiezoelectric PropertiesThin Film Process TechnologyMicro-electromechanical System	2006	32
A focus sensor for an application in a nanopositioning and nanomeasuring machine Rostyslav Mastylo, Denis Dontsov, Eberhard Manske, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE HolographyEngineeringOptical TestingHologram Laser UnitSensor Technology	2005	31
Overcoming the refractivity limit in manufacturing environment Karl Meiners-Hagen, Tobias Meyer, Günther Prellinger, Optics Express EngineeringMeasurementOptical TestingInterferometryOptical Metrology	2016	26
Interferometric device for the in-process measurement of diameter variation in the manufacture of ultraprecise spheres Rudolf Meeß, Denis Dontsov, Enrico Langlotz Measurement Science and Technology EngineeringMeasurementOptic DesignMechanical EngineeringOptical Testing	2021	15
Measurement Precision of a Planar Nanopositioning Machine with a Range of Motion of Ø100 mm Jaqueline Stauffenberg, Ingo Ortlepp, Johannes Belkner, Applied Sciences EngineeringMeasurementTrajectory DeviationMechanical EngineeringField Robotics	2022	13
Integrated Planar 6-DOF Nanopositioning System Stephan Gorges, Steffen Hesse, Christoph Schäffel, IFAC-PapersOnLine Multichannel Interferometer SystemEngineeringBottom-up SynthesisEducationNanocomputing	2019	12

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