Concepedia

Johanna Reck

JR

Statistics

Publications

2

Citations

20

H-Index

2

Active since

2019

Affiliations

SENTECH Instruments (Germany)(Current)

Johanna Reck is an author at SENTECH Instruments (Germany) specializing in ellipsometry, polarimetric metrology, and thin film optical properties.

Publications per year

2019–2020

2

Publications

2

Some aspects on the uncertainty calculation in Mueller ellipsometry

M. Wurm, Tobias Grunewald, Sven Teichert et al. · Optics Express · 2019 · 10 citations · Full text

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<i>In situ</i> real-time and <i>ex situ</i> spectroscopic analysis of Al2O3 films prepared by plasma enhanced atomic layer deposition

Franziska Naumann, Johanna Reck, Hassan Gargouri et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2020 · 10 citations

, , +17

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