Rosario D’Esposito

Thermal Penetration Depth Analysis and Impact of the BEOL Metals on the Thermal Impedance of SiGe HBTs

Rosario D’Esposito, Suresh Balanethiram, Jean‐Luc Battaglia et al. · IEEE Electron Device Letters · 2017 · 21 citations

Engineering, Integrated Circuits, Thermal Conductivity +23

Analytic Estimation of Thermal Resistance in HBTs

Anjan Chakravorty, Rosario D’Esposito, Suresh Balanethiram et al. · IEEE Transactions on Electron Devices · 2016 · 19 citations

Engineering, Thermal Conductivity, Semiconductor Device +16

Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs

Suresh Balanethiram, Rosario D’Esposito, Sébastien Frégonèse et al. · 2017 · 19 citations

Engineering, Temperature Dependence, Sige Hbt +22

Accurate Modeling of Thermal Resistance for On-Wafer SiGe HBTs Using Average Thermal Conductivity

Suresh Balanethiram, Anjan Chakravorty, Rosario D’Esposito et al. · IEEE Transactions on Electron Devices · 2017 · 17 citations

Engineering, Beol Thermal Resistance, Integrated Circuits +20

Effects of BEOL on self-heating and thermal coupling in SiGe multi-finger HBTs under real operating condition

Arun Dev Dhar Dwivedi, Anjan Chakravorty, Rosario D’Esposito et al. · Solid-State Electronics · 2015 · 16 citations

Electrical Engineering, Sige Multi-finger Hbts, Thermal Coupling +15