A. Ditali - Concepedia

Author

A. Ditali

Micron (United States)

Also Known As

A. Ditali, Akram Ditali

Publications

211

Citations

H-Index

Concepts

All Affiliations

Micron (United States)

About

A. Ditali is an author at Micron (United States) specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	169
2	Applied Physics	7	7	117
3	Computer Engineering	3	3	52
4	Health Sciences	2	2	33
5	Construction Engineering	1	1	19

A. Ditali

Publications

182

Citations

H-Index

Page 1

	Year	Citations
Effects of wafer bow and warpage on the integrity of thin gate oxides R. P. S. Thakur, Nitin Chhabra, A. Ditali Applied Physics Letters Materials ScienceDefect ToleranceElectrical EngineeringThin Gate OxidesEngineering	1994	25
Reliability and Characterization of Composite Oxide/Nitride Dielectrics for Multi‐Megabit Dynamic Random Access Memory Stacked Capacitors P. Fazan, A. Ditali, Charles H. Dennison, Journal of The Electrochemical Society Materials ScienceNon-volatile MemoryElectrical EngineeringEngineeringComposite Oxide/nitride Dielectrics	1991	22
Building-in reliability: soft errors-a case study Zille Hasnain, A. Ditali EngineeringSmart ManufacturingIntegrated CircuitsDefect ToleranceHardware Systems	1992	19
Hot-carrier-induced degradation of gate dielectrics grown in nitrous oxide under accelerated aging A. Ditali, V.K. Mathews, P. Fazan IEEE Electron Device Letters Materials ScienceGate DielectricsElectrical EngineeringNitrous OxideEngineering	1992	18
X-Ray Radiation Effect in DRAM Retention Time A. Ditali, Manny Kin, Michael B. Johnston IEEE Transactions on Device and Materials Reliability EngineeringRadiation EffectRadiation ExposureIntegrated CircuitsRadiation Protection	2007	18
Uniqueness in Activation Energy and Charge-to-Breakdown of Highly Asymmetrical DRAM&lt;tex&gt;$hbox Al_2 hbox O_3$&lt;/tex&gt;Cell Capacitors Parag Banerjee, A. Ditali IEEE Electron Device Letters EngineeringEmerging Memory TechnologyPhase Change MemoryHighly Asymmetrical DramAl/sub 2/O/sub	2004	15
X-Ray Inspection-Induced Latent Damage in DRAM A. Ditali, Manny Ma, Michael B. Johnston X-ray SpectroscopyEngineeringRadiation ExposureRadiation ProtectionHardware Security	2006	15
Ultrathin oxide-nitride dielectrics for rugged stacked DRAM capacitors P. Fazan, V.K. Mathews, H. C. Chan, IEEE Electron Device Letters Materials ScienceElectrical EngineeringMaterial AnalysisEngineering256-Mb Stacked Drams	1992	14
Electrical characterization of textured interpoly capacitors for advanced stacked DRAMs P. Fazan, A. Ditali Materials ScienceAdvanced PackagingElectrical EngineeringDielectricsTextured Interpoly Capacitors	2002	13
Building-In Reliability: Soft Errors-A Case Study Zille Hasnain, A. Ditali	1992	13

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