Concepedia

Jih Lien

JL

Statistics

Publications

5

Citations

288

H-Index

5

Active since

1987

Affiliations

Advanced Micro Devices (United States)(Current)

Jih Lien is an author at Advanced Micro Devices (United States) specializing in engineering, semiconductor devices, and electrical engineering.

Publications per year

1987–2002

5

Publications

5

Corner-field induced drain leakage in thin oxide MOSFETs

Chi Chang, Jih Lien · 1987 · 100 citations

Engineering, Electrical Engineering, Microelectronics +16

Degradations due to hole trapping in flash memory cells

S. Haddad, Chih‐Yung Chang, Balaji Swaminathan et al. · IEEE Electron Device Letters · 1989 · 75 citations

Engineering, Computer Engineering, Electrical Engineering +16

An investigation of erase-mode dependent hole trapping in flash EEPROM memory cell

S. Haddad, Chih‐Yung Chang, Annie G. Wang et al. · IEEE Electron Device Letters · 1990 · 59 citations

Engineering, Computer Engineering, Electrical Engineering +17

Drain-avalanche and hole-trapping induced gate leakage in thin-oxide MOS devices

Chih‐Yung Chang, S. Haddad, Balaji Swaminathan et al. · IEEE Electron Device Letters · 1988 · 44 citations

Engineering, Electrical Engineering, Materials Science +17

Flash EPROM endurance simulation using physics-based models

Jiahe Peng, S. Haddad, Hao Fang et al. · 2002 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +17

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