Balaji Swaminathan

Degradations due to hole trapping in flash memory cells

S. Haddad, Chih‐Yung Chang, Balaji Swaminathan et al. · IEEE Electron Device Letters · 1989 · 75 citations

Non-volatile Memory, Flash Memory Cells, Engineering +16

Drain-avalanche and hole-trapping induced gate leakage in thin-oxide MOS devices

Chih‐Yung Chang, S. Haddad, Balaji Swaminathan et al. · IEEE Electron Device Letters · 1988 · 44 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +15

A unified model for the ZVS DC-DC converters with active clamp

N Lakshminarasamma, Balaji Swaminathan, V. Ramanarayanan · 2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551) · 2005 · 24 citations

Generalized Equivalent Circuit, Electrical Engineering, Hard-switched Pwm Converters +14

Symmetric BSIM-SOI—Part I: A Compact Model for Dynamically Depleted SOI MOSFETs

Chetan Kumar Dabhi, Dinesh Rajasekharan, Girish Pahwa et al. · IEEE Transactions on Electron Devices · 2024 · 16 citations

Application of network analyzer in measuring the performance functions of power supply

Balaji Swaminathan, V. Ramanarayanan · 2013 · 12 citations

Electrical Engineering, Power Engineering, Engineering +11